Using available ports on a device for end-product testing

MIPI Narrow Interface for Debug and Test (MIPI NIDnTSM) defines a standardized way to use functional ports on a device for debug and test procedures. The specification makes it easier for developers to identify problems in complex designs to ensure high-quality products. It also reduces development costs because it alleviates the need for expensive, proprietary testing tools.

A key feature of MIPI NIDnT v1.2 is an innovative use of USB Type-C v1.2 "alternate modes" to facilitate debug and test over USB Type-C pins. The capability provides conveniences to developers in many device segments because USB Type-C is gaining popularity as a robust connector for small, thin devices such as smartphones, tablets and laptops as well as IoT, augmented reality and virtual reality products. 

MIPI NIDnT v1.2 is versatile, offering designers the flexibility to perform debug and test over other interfaces that are widely used in mobile and mobile-influenced designs. Interfaces supported by the specification include USB 2.0 Micro-B/-AB, microSD, HDMI and DisplayPort.

MIPI NIDnT v1.2 and the MIPI Discovery and Configuration Specification for Narrow Interface for Debug and Test v1.0SM (MIPI DisCo for NIDnT v1.0) complement each other. This is a standardized software tool that makes it possible for test device software to easily discover and configure the hardware debug and test capabilities enabled by MIPI NIDnT.

To learn more about MIPI Debug specifications, please visit the Debug section of the MIPI website.

All MIPI debug and trace specifications, including MIPI NIDnT, are available for download and use by the public and the open source community. Members of the MIPI Alliance enjoy benefits including access to relevant licenses and opportunities to participate in development activities, interoperability workshops and other events.

For information about MIPI Alliance membership, visit Join MIPI.