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    MIPI Alliance Blog:

    The Wires Behind Wireless

    HTI v1.1 Tightens Electrical Properties To Boost Trace Reliability at Higher Speeds

    For those involved in debug and trace projects, one of the fundamental challenges is how to extract greater volumes of trace data from ever more complex devices, using ever-increasing higher-speed serial interfaces. This challenge is driven by the product of more—more data being transmitted inside devices, more functions happening at once on a die, and more components being integrated within devices. And the challenge is universal regardless of the application area—whether it's the Internet of Things (IoT), automotive, 5G or other areas. 

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    Tags: Debug, MIPI HTI
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