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    MIPI Alliance Blog:

    The Wires Behind Wireless

    Mohamed Hafed, Ph.D., CEO at Introspect Technology

    Mohamed Hafed, Ph.D., CEO at Introspect Technology

    Recent Posts

    Addressing the Challenges in High-Volume Production Testing of MIPI-Specification-Based Devices

    The latest trend for semiconductor device manufacturers is to add several high-speed MIPI® specification-based ports to a single device. This enables feature-rich implementations of imaging- and display-intensive applications, although it also poses significant challenges for production test engineers who are tasked with creating high-fault coverage testing solutions on automated test equipment (ATE). Such fault coverage often entails creating a parallel, at-speed, system-oriented functional test while simultaneously grappling with the limitations of legacy ATE and the complexity of the MIPI protocols being tested. This post describes production testing methodologies of MIPI-based devices on any ATE platform, whether it is at the wafer test stage or the final test stage.

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    Tags: Camera, Test, D-PHY, C-PHY